This project aimed at advancing wireless sensing with backscattering technology (e.g.: RFID) by developing the Tunneling RFID Tag. Although already commercially available and widely used in several applications, wireless sensors still require a significant amount of power to operate and are still limited in range. The Tunneling Tag demonstrated that a long-range (> 650 meters) and low-powered (< 45 uW) backscattering link at 5.8 GHz is possible by exploiting the quantum tunneling effect of tunnel diodes. The Tunneling Tag achieved return gains as high as 35 dB with link sensitivity as low as −81 dBm.
Tunneling Reflector load for the Tunneling Tag – Gerber file available upon request
Experimental data from measurement campaign at Georgia Tech Campus and Midtown Atlanta – GitHub repository
F. Amato, “Achieving hundreds-meter ranges in low powered RFID systems with quantum tunneling tags“, Georgia Tech Library, 2017, Full text
, IEEE Transactions on Wireless Communications, , , and , “RFID Backscattering in Long-Range Scenarios”2018, DOI: 10.1109/TWC.2018.2801803
F. Amato, C. W. Peterson, B. P. Degnan, and D. G. Durgin, “Tunneling RFID Tags for Long-Range and Low-Power Microwave Applications”, IEEE Journal of Radio Frequency Identification, 2018, DOI: 10.1109/JRFID.2018.2852498
F. Amato, and D. G. Durgin, “The Resurrection of the Esaki Diode: Tunneling Becomes Cool Again”; IEEE Virtual Journal on RFID, 2017, DOI: 10.1109/RFIDVJ.2017.0000013
K. Gumber, F. Amato, C. Dejous and S. Hemour, “Nonlinear Negative Resistance-based Harmonic Backscatter,” 2020 IEEE/MTT-S International Microwave Symposium (IMS), Los Angeles, CA, USA, 2020, pp. 603-606, DOI: 10.1109/IMS30576.2020.9223877.
IEEE International Conference on RFID-Technologies and Applications (RFID-TA), 2015, DOI: 10.1109/RFID-TA.2015.7379815, , , and , “Long range and low powered RFID tags with tunnel diode“,
F. Amato, C. W. Peterson, B. P. Degnan and G. D. Durgin, “A 45 μW bias power, 34 dB gain reflection amplifier exploiting the tunneling effect for RFID applications,” IEEE International Conference on RFID (RFID), 2015, DOI: 10.1109/RFID.2015.7113084